incoming inspection Archives

A Novel Adaptive IC for Protecting COTS against SEL

Discover the main risks of using COTS electronics in space, including TID degradation, SEE, and Single-Event Latch-up.
Why SEL is one of the most critical radiation-induced failure mechanisms for mission reliability.

Why nitrogen storage is not enough for electronic components

Nitrogen storage alone cannot prevent diffusion, oxidation and moisture damage in electronic components during long-term preservation.

What causes aging in electronic components during storage?

Learn what causes electronic component aging during storage, including oxidation, moisture, diffusion and material degradation.

Long-Term Storage of Semiconductor Wafers and DIEs

Discover how semiconductor storage preserves wafers and dies, reducing contamination, oxidation and obsolescence risks.

Long-term storage of electronic displays

Learn how electronic display storage prevents oxidation, moisture damage and optical degradation while preserving long-term reliability.

Long-term storage of electronic assemblies and devices

Learn how electronics storage protects assemblies and devices from corrosion, moisture, contamination and obsolescence.

SEL-PROTECTS Project: Single-Event Latch-up PROTECTion devices for Space

SEL-PROTECTS develops an adaptive mixed-signal IC that protects COTS space electronics from Single-Event Latch-Up (SEL) by monitoring current consumption and autonomously disconnecting power before destructive radiation events occur.

Inside the Component (Part II): Cross-Section Testing for Space Qualification & ECSS Compliance

In the second session of our “Inside the Component” series, we explore the cross-section tests required to certify electronic components for space missions. From PCB evaluations to wire-crimping and press-fit qualification, this session shows how cross-sectioning provides the physical evidence demanded by ECSS standards. You will learn how these results support destructive physical analysis (DPA), uncover manufacturing defects, and determine whether a device is truly fit for purpose in the extreme environment of space. Ideal for quality managers, project leaders, and professionals involved in space component qualification.

Inside the Component (Part I): Mastering Cross-Section Sample Preparation for Space Electronics

Discover why rigorous cross-section sample preparation is essential for accurate failure analysis and reliability verification in space-grade electronics. This webinar walks you through every step, cutting, mounting, grinding, and polishing, and explains how each stage affects the quality and reproducibility of microsections.