EMC tests Archives

A Novel Adaptive IC for Protecting COTS against SEL

Discover the main risks of using COTS electronics in space, including TID degradation, SEE, and Single-Event Latch-up.
Why SEL is one of the most critical radiation-induced failure mechanisms for mission reliability.

Why Nitrogen Storage Is Not Enough for Electronic Components

Nitrogen storage addresses only a limited subset of aging factors.

It does not control: Diffusion, Internal contamination, Material interactions, Long-term degradation processes.
For true long-term preservation, a holistic storage approach is required

What Causes Aging in Electronic Components During Storage?

Electronic component aging is driven by multiple interacting factors. To ensure long-term availability and reliability, storage strategies must address all degradation mechanisms simultaneously.

Long-Term Storage of Semiconductor Wafers and DIEs

Discover how to preserve wafers and DIEs for up to 50 years while preventing diffusion, contamination, and performance degradation.

Long-Term Storage of Electronic Displays

Discover how to preserve electronic displays for up to 50 years. Learn about aging risks, material degradation, and advanced long-term storage solutions.

Long-Term Storage of Electronic Assemblies and Devices

Learn how to store electronic assemblies and devices for up to 50 years while preventing failures, corrosion, and obsolescence risks.

SEL-PROTECTS Project: Single-Event Latch-up PROTECTion devices for Space

SEL-PROTECTS develops an adaptive mixed-signal IC that protects COTS space electronics from Single-Event Latch-Up (SEL) by monitoring current consumption and autonomously disconnecting power before destructive radiation events occur.

Inside the Component (Part II): Cross-Section Testing for Space Qualification & ECSS Compliance

In the second session of our “Inside the Component” series, we explore the cross-section tests required to certify electronic components for space missions. From PCB evaluations to wire-crimping and press-fit qualification, this session shows how cross-sectioning provides the physical evidence demanded by ECSS standards. You will learn how these results support destructive physical analysis (DPA), uncover manufacturing defects, and determine whether a device is truly fit for purpose in the extreme environment of space. Ideal for quality managers, project leaders, and professionals involved in space component qualification.

Inside the Component (Part I): Mastering Cross-Section Sample Preparation for Space Electronics

Discover why rigorous cross-section sample preparation is essential for accurate failure analysis and reliability verification in space-grade electronics. This webinar walks you through every step, cutting, mounting, grinding, and polishing, and explains how each stage affects the quality and reproducibility of microsections.