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A Novel Adaptive IC for Protecting COTS against SEL
Discover the main risks of using COTS electronics in space, including TID degradation, SEE, and Single-Event Latch-up.
Why SEL is one of the most critical radiation-induced failure mechanisms for mission reliability.
Latest articles
A Novel Adaptive IC for Protecting COTS against SEL
Discover the main risks of using COTS electronics in space, including TID degradation, SEE, and Single-Event Latch-up.
Why SEL is one of the most critical radiation-induced failure mechanisms for mission reliability.
Why nitrogen storage is not enough for electronic components
Nitrogen storage alone cannot prevent diffusion, oxidation and moisture damage in electronic components during long-term preservation.
What causes aging in electronic components during storage?
Learn what causes electronic component aging during storage, including oxidation, moisture, diffusion and material degradation.
Long-Term Storage of Semiconductor Wafers and DIEs
Long-term storage of semiconductor wafers and bare dies to preserve reliability, usability and availability for future applications.
Long-term storage of electronic displays
Learn how electronic display storage prevents oxidation, moisture damage and optical degradation while preserving long-term reliability.
Long-term storage of electronic assemblies and devices
Learn how electronics storage protects assemblies and devices from corrosion, moisture, contamination and obsolescence.
SEL-PROTECTS Project: Single-Event Latch-up PROTECTion devices for Space
SEL-PROTECTS develops an adaptive mixed-signal IC that protects COTS space electronics from Single-Event Latch-Up (SEL) by monitoring current consumption and autonomously disconnecting power before destructive radiation events occur.
Inside the Component (Part II): Cross-Section Testing for Space Qualification & ECSS Compliance
In the second session of our “Inside the Component” series, we explore the cross-section tests required to certify electronic components for space missions. From PCB evaluations to wire-crimping and press-fit qualification, this session shows how cross-sectioning provides the physical evidence demanded by ECSS standards. You will learn how these results support destructive physical analysis (DPA), uncover manufacturing defects, and determine whether a device is truly fit for purpose in the extreme environment of space. Ideal for quality managers, project leaders, and professionals involved in space component qualification.
Inside the Component (Part I): Mastering Cross-Section Sample Preparation for Space Electronics
Discover why rigorous cross-section sample preparation is essential for accurate failure analysis and reliability verification in space-grade electronics. This webinar walks you through every step, cutting, mounting, grinding, and polishing, and explains how each stage affects the quality and reproducibility of microsections.
EEE parts engineering and Product Assurance for space missions
EEE parts engineering and product assurance for space missions, including DCL support, radiation analysis, testing, and ESA/NASA compliance.
A Novel Adaptive IC for Protecting COTS against SEL
Discover the main risks of using COTS electronics in space, including TID degradation, SEE, and Single-Event Latch-up.
Why SEL is one of the most critical radiation-induced failure mechanisms for mission reliability.
Why nitrogen storage is not enough for electronic components
Nitrogen storage alone cannot prevent diffusion, oxidation and moisture damage in electronic components during long-term preservation.
What causes aging in electronic components during storage?
Learn what causes electronic component aging during storage, including oxidation, moisture, diffusion and material degradation.
Long-Term Storage of Semiconductor Wafers and DIEs
Long-term storage of semiconductor wafers and bare dies to preserve reliability, usability and availability for future applications.
Long-term storage of electronic displays
Learn how electronic display storage prevents oxidation, moisture damage and optical degradation while preserving long-term reliability.
Long-term storage of electronic assemblies and devices
Learn how electronics storage protects assemblies and devices from corrosion, moisture, contamination and obsolescence.
SEL-PROTECTS Project: Single-Event Latch-up PROTECTion devices for Space
SEL-PROTECTS develops an adaptive mixed-signal IC that protects COTS space electronics from Single-Event Latch-Up (SEL) by monitoring current consumption and autonomously disconnecting power before destructive radiation events occur.
Inside the Component (Part II): Cross-Section Testing for Space Qualification & ECSS Compliance
In the second session of our “Inside the Component” series, we explore the cross-section tests required to certify electronic components for space missions. From PCB evaluations to wire-crimping and press-fit qualification, this session shows how cross-sectioning provides the physical evidence demanded by ECSS standards. You will learn how these results support destructive physical analysis (DPA), uncover manufacturing defects, and determine whether a device is truly fit for purpose in the extreme environment of space. Ideal for quality managers, project leaders, and professionals involved in space component qualification.
Inside the Component (Part I): Mastering Cross-Section Sample Preparation for Space Electronics
Discover why rigorous cross-section sample preparation is essential for accurate failure analysis and reliability verification in space-grade electronics. This webinar walks you through every step, cutting, mounting, grinding, and polishing, and explains how each stage affects the quality and reproducibility of microsections.
EEE parts engineering and Product Assurance for space missions
EEE parts engineering and product assurance for space missions, including DCL support, radiation analysis, testing, and ESA/NASA compliance.
Access to Electronic Design
Design for Manufacturing (DFM) and assembly.
The document underscores that adopting DFM techniques early in the project lifecycle ensures smoother production, lower costs, and quicker time-to-market for electronic products.
Long-Term Storage of Semiconductor Wafers and DIEs
Long-term storage of semiconductor wafers and bare dies to preserve reliability, usability and availability for future applications.
Long-term storage of electronic displays
Learn how electronic display storage prevents oxidation, moisture damage and optical degradation while preserving long-term reliability.
Long-term storage of electronic assemblies and devices
Learn how electronics storage protects assemblies and devices from corrosion, moisture, contamination and obsolescence.
SEL-PROTECTS Project: Single-Event Latch-up PROTECTion devices for Space
SEL-PROTECTS develops an adaptive mixed-signal IC that protects COTS space electronics from Single-Event Latch-Up (SEL) by monitoring current consumption and autonomously disconnecting power before destructive radiation events occur.
Inside the Component (Part II): Cross-Section Testing for Space Qualification & ECSS Compliance
In the second session of our “Inside the Component” series, we explore the cross-section tests required to certify electronic components for space missions. From PCB evaluations to wire-crimping and press-fit qualification, this session shows how cross-sectioning provides the physical evidence demanded by ECSS standards. You will learn how these results support destructive physical analysis (DPA), uncover manufacturing defects, and determine whether a device is truly fit for purpose in the extreme environment of space. Ideal for quality managers, project leaders, and professionals involved in space component qualification.
Inside the Component (Part I): Mastering Cross-Section Sample Preparation for Space Electronics
Discover why rigorous cross-section sample preparation is essential for accurate failure analysis and reliability verification in space-grade electronics. This webinar walks you through every step, cutting, mounting, grinding, and polishing, and explains how each stage affects the quality and reproducibility of microsections.
EEE parts engineering and Product Assurance for space missions
EEE parts engineering and product assurance for space missions, including DCL support, radiation analysis, testing, and ESA/NASA compliance.
Advanced Materials for Space Radiation Shielding
Discover how the SRPROTEC project develops advanced composite materials to shield electronics from harmful space radiation
Physical Characterization of QFN Test Vehicles Manufactured with Radiation-Shielding Materials
Explore SRPROTEC project QFN test vehicles made with novel radiation-shielding composites for advanced electronic protection
Characterization of Novel Composite Materials with Radiation Shielding Properties for Electronic Encapsulation (SRPROTEC Project)
Discover SRPROTEC project innovations: novel composite materials with advanced radiation shielding for safe and reliable electronic encapsulation
Entangled photon sources for quantum communications
Entangled Photon Sources enable secure quantum communication through SPDC, ideal for high-loss space applications.
Electromagnetic Compatibility EMC requirements and testing
Electromagnetic Compatibility (EMC) ensures devices operate reliably without causing or suffering electromagnetic interference.
Long-term storage of electronic assemblies and devices
Learn how electronics storage protects assemblies and devices from corrosion, moisture, contamination and obsolescence.
SEL-PROTECTS Project: Single-Event Latch-up PROTECTion devices for Space
SEL-PROTECTS develops an adaptive mixed-signal IC that protects COTS space electronics from Single-Event Latch-Up (SEL) by monitoring current consumption and autonomously disconnecting power before destructive radiation events occur.
A Novel Adaptive IC for Protecting COTS against SEL
Discover the main risks of using COTS electronics in space, including TID degradation, SEE, and Single-Event Latch-up.
Why SEL is one of the most critical radiation-induced failure mechanisms for mission reliability.
Why nitrogen storage is not enough for electronic components
Nitrogen storage alone cannot prevent diffusion, oxidation and moisture damage in electronic components during long-term preservation.
What causes aging in electronic components during storage?
Learn what causes electronic component aging during storage, including oxidation, moisture, diffusion and material degradation.
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A Novel Adaptive IC for Protecting COTS against SEL
Discover the main risks of using COTS electronics in space, including TID degradation, SEE, and Single-Event Latch-up.
Why SEL is one of the most critical radiation-induced failure mechanisms for mission reliability.
Why nitrogen storage is not enough for electronic components
Nitrogen storage alone cannot prevent diffusion, oxidation and moisture damage in electronic components during long-term preservation.
What causes aging in electronic components during storage?
Learn what causes electronic component aging during storage, including oxidation, moisture, diffusion and material degradation.
Long-Term Storage of Semiconductor Wafers and DIEs
Long-term storage of semiconductor wafers and bare dies to preserve reliability, usability and availability for future applications.
Long-term storage of electronic displays
Learn how electronic display storage prevents oxidation, moisture damage and optical degradation while preserving long-term reliability.
Long-term storage of electronic assemblies and devices
Learn how electronics storage protects assemblies and devices from corrosion, moisture, contamination and obsolescence.
SEL-PROTECTS Project: Single-Event Latch-up PROTECTion devices for Space
SEL-PROTECTS develops an adaptive mixed-signal IC that protects COTS space electronics from Single-Event Latch-Up (SEL) by monitoring current consumption and autonomously disconnecting power before destructive radiation events occur.
Inside the Component (Part II): Cross-Section Testing for Space Qualification & ECSS Compliance
In the second session of our “Inside the Component” series, we explore the cross-section tests required to certify electronic components for space missions. From PCB evaluations to wire-crimping and press-fit qualification, this session shows how cross-sectioning provides the physical evidence demanded by ECSS standards. You will learn how these results support destructive physical analysis (DPA), uncover manufacturing defects, and determine whether a device is truly fit for purpose in the extreme environment of space. Ideal for quality managers, project leaders, and professionals involved in space component qualification.
Inside the Component (Part I): Mastering Cross-Section Sample Preparation for Space Electronics
Discover why rigorous cross-section sample preparation is essential for accurate failure analysis and reliability verification in space-grade electronics. This webinar walks you through every step, cutting, mounting, grinding, and polishing, and explains how each stage affects the quality and reproducibility of microsections.
EEE parts engineering and Product Assurance for space missions
EEE parts engineering and product assurance for space missions, including DCL support, radiation analysis, testing, and ESA/NASA compliance.
Access to Electronic Design
Design for Manufacturing (DFM) and assembly
The document underscores that adopting DFM techniques early in the project lifecycle ensures smoother production, lower costs, and quicker time-to-market for electronic products.
Long-term storage of electronic assemblies and devices
Learn how electronics storage protects assemblies and devices from corrosion, moisture, contamination and obsolescence.
SEL-PROTECTS Project: Single-Event Latch-up PROTECTion devices for Space
SEL-PROTECTS develops an adaptive mixed-signal IC that protects COTS space electronics from Single-Event Latch-Up (SEL) by monitoring current consumption and autonomously disconnecting power before destructive radiation events occur.
Inside the Component (Part II): Cross-Section Testing for Space Qualification & ECSS Compliance
In the second session of our “Inside the Component” series, we explore the cross-section tests required to certify electronic components for space missions. From PCB evaluations to wire-crimping and press-fit qualification, this session shows how cross-sectioning provides the physical evidence demanded by ECSS standards. You will learn how these results support destructive physical analysis (DPA), uncover manufacturing defects, and determine whether a device is truly fit for purpose in the extreme environment of space. Ideal for quality managers, project leaders, and professionals involved in space component qualification.
Inside the Component (Part I): Mastering Cross-Section Sample Preparation for Space Electronics
Discover why rigorous cross-section sample preparation is essential for accurate failure analysis and reliability verification in space-grade electronics. This webinar walks you through every step, cutting, mounting, grinding, and polishing, and explains how each stage affects the quality and reproducibility of microsections.
EEE parts engineering and Product Assurance for space missions
EEE parts engineering and product assurance for space missions, including DCL support, radiation analysis, testing, and ESA/NASA compliance.
Advanced Materials for Space Radiation Shielding
Discover how the SRPROTEC project develops advanced composite materials to shield electronics from harmful space radiation
Physical Characterization of QFN Test Vehicles Manufactured with Radiation-Shielding Materials
Explore SRPROTEC project QFN test vehicles made with novel radiation-shielding composites for advanced electronic protection
Characterization of Novel Composite Materials with Radiation Shielding Properties for Electronic Encapsulation (SRPROTEC Project)
Discover SRPROTEC project innovations: novel composite materials with advanced radiation shielding for safe and reliable electronic encapsulation
Entangled photon sources for quantum communications
Entangled Photon Sources enable secure quantum communication through SPDC, ideal for high-loss space applications.
Electromagnetic Compatibility EMC requirements and testing
Electromagnetic Compatibility (EMC) ensures devices operate reliably without causing or suffering electromagnetic interference.
Long-term storage of electronic assemblies and devices
Learn how electronics storage protects assemblies and devices from corrosion, moisture, contamination and obsolescence.
SEL-PROTECTS Project: Single-Event Latch-up PROTECTion devices for Space
SEL-PROTECTS develops an adaptive mixed-signal IC that protects COTS space electronics from Single-Event Latch-Up (SEL) by monitoring current consumption and autonomously disconnecting power before destructive radiation events occur.
Inside the Component (Part II): Cross-Section Testing for Space Qualification & ECSS Compliance
In the second session of our “Inside the Component” series, we explore the cross-section tests required to certify electronic components for space missions. From PCB evaluations to wire-crimping and press-fit qualification, this session shows how cross-sectioning provides the physical evidence demanded by ECSS standards. You will learn how these results support destructive physical analysis (DPA), uncover manufacturing defects, and determine whether a device is truly fit for purpose in the extreme environment of space. Ideal for quality managers, project leaders, and professionals involved in space component qualification.
Inside the Component (Part I): Mastering Cross-Section Sample Preparation for Space Electronics
Discover why rigorous cross-section sample preparation is essential for accurate failure analysis and reliability verification in space-grade electronics. This webinar walks you through every step, cutting, mounting, grinding, and polishing, and explains how each stage affects the quality and reproducibility of microsections.
EEE parts engineering and Product Assurance for space missions
EEE parts engineering and product assurance for space missions, including DCL support, radiation analysis, testing, and ESA/NASA compliance.
Advanced Materials for Space Radiation Shielding
Discover how the SRPROTEC project develops advanced composite materials to shield electronics from harmful space radiation
Physical Characterization of QFN Test Vehicles Manufactured with Radiation-Shielding Materials
Explore SRPROTEC project QFN test vehicles made with novel radiation-shielding composites for advanced electronic protection
Characterization of Novel Composite Materials with Radiation Shielding Properties for Electronic Encapsulation (SRPROTEC Project)
Discover SRPROTEC project innovations: novel composite materials with advanced radiation shielding for safe and reliable electronic encapsulation
Entangled photon sources for quantum communications
Entangled Photon Sources enable secure quantum communication through SPDC, ideal for high-loss space applications.
Electromagnetic Compatibility EMC requirements and testing
Electromagnetic Compatibility (EMC) ensures devices operate reliably without causing or suffering electromagnetic interference.