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A Novel Adaptive IC for Protecting COTS against SEL
Discover the main risks of using COTS electronics in space, including TID degradation, SEE, and Single-Event Latch-up.
Why SEL is one of the most critical radiation-induced failure mechanisms for mission reliability.
Latest news
A Novel Adaptive IC for Protecting COTS against SEL
Discover the main risks of using COTS electronics in space, including TID degradation, SEE, and Single-Event Latch-up.
Why SEL is one of the most critical radiation-induced failure mechanisms for mission reliability.
Why Nitrogen Storage Is Not Enough for Electronic Components
Nitrogen storage addresses only a limited subset of aging factors.
It does not control: Diffusion, Internal contamination, Material interactions, Long-term degradation processes.
For true long-term preservation, a holistic storage approach is required
What Causes Aging in Electronic Components During Storage?
Electronic component aging is driven by multiple interacting factors. To ensure long-term availability and reliability, storage strategies must address all degradation mechanisms simultaneously.
Long-Term Storage of Semiconductor Wafers and DIEs
Discover how to preserve wafers and DIEs for up to 50 years while preventing diffusion, contamination, and performance degradation.
Long-Term Storage of Electronic Displays
Discover how to preserve electronic displays for up to 50 years. Learn about aging risks, material degradation, and advanced long-term storage solutions.
Long-Term Storage of Electronic Assemblies and Devices
Learn how to store electronic assemblies and devices for up to 50 years while preventing failures, corrosion, and obsolescence risks.
SEL-PROTECTS Project: Single-Event Latch-up PROTECTion devices for Space
SEL-PROTECTS develops an adaptive mixed-signal IC that protects COTS space electronics from Single-Event Latch-Up (SEL) by monitoring current consumption and autonomously disconnecting power before destructive radiation events occur.
Inside the Component (Part II): Cross-Section Testing for Space Qualification & ECSS Compliance
In the second session of our “Inside the Component” series, we explore the cross-section tests required to certify electronic components for space missions. From PCB evaluations to wire-crimping and press-fit qualification, this session shows how cross-sectioning provides the physical evidence demanded by ECSS standards. You will learn how these results support destructive physical analysis (DPA), uncover manufacturing defects, and determine whether a device is truly fit for purpose in the extreme environment of space. Ideal for quality managers, project leaders, and professionals involved in space component qualification.
Inside the Component (Part I): Mastering Cross-Section Sample Preparation for Space Electronics
Discover why rigorous cross-section sample preparation is essential for accurate failure analysis and reliability verification in space-grade electronics. This webinar walks you through every step, cutting, mounting, grinding, and polishing, and explains how each stage affects the quality and reproducibility of microsections.
EEE parts engineering and Product Assurance for space missions
EEE parts engineering and product assurance for space missions, including DCL support, radiation analysis, testing, and ESA/NASA compliance.
A Novel Adaptive IC for Protecting COTS against SEL
Discover the main risks of using COTS electronics in space, including TID degradation, SEE, and Single-Event Latch-up.
Why SEL is one of the most critical radiation-induced failure mechanisms for mission reliability.
Why Nitrogen Storage Is Not Enough for Electronic Components
Nitrogen storage addresses only a limited subset of aging factors.
It does not control: Diffusion, Internal contamination, Material interactions, Long-term degradation processes.
For true long-term preservation, a holistic storage approach is required
What Causes Aging in Electronic Components During Storage?
Electronic component aging is driven by multiple interacting factors. To ensure long-term availability and reliability, storage strategies must address all degradation mechanisms simultaneously.
Long-Term Storage of Semiconductor Wafers and DIEs
Discover how to preserve wafers and DIEs for up to 50 years while preventing diffusion, contamination, and performance degradation.
Long-Term Storage of Electronic Displays
Discover how to preserve electronic displays for up to 50 years. Learn about aging risks, material degradation, and advanced long-term storage solutions.
Long-Term Storage of Electronic Assemblies and Devices
Learn how to store electronic assemblies and devices for up to 50 years while preventing failures, corrosion, and obsolescence risks.
SEL-PROTECTS Project: Single-Event Latch-up PROTECTion devices for Space
SEL-PROTECTS develops an adaptive mixed-signal IC that protects COTS space electronics from Single-Event Latch-Up (SEL) by monitoring current consumption and autonomously disconnecting power before destructive radiation events occur.
Inside the Component (Part II): Cross-Section Testing for Space Qualification & ECSS Compliance
In the second session of our “Inside the Component” series, we explore the cross-section tests required to certify electronic components for space missions. From PCB evaluations to wire-crimping and press-fit qualification, this session shows how cross-sectioning provides the physical evidence demanded by ECSS standards. You will learn how these results support destructive physical analysis (DPA), uncover manufacturing defects, and determine whether a device is truly fit for purpose in the extreme environment of space. Ideal for quality managers, project leaders, and professionals involved in space component qualification.
Inside the Component (Part I): Mastering Cross-Section Sample Preparation for Space Electronics
Discover why rigorous cross-section sample preparation is essential for accurate failure analysis and reliability verification in space-grade electronics. This webinar walks you through every step, cutting, mounting, grinding, and polishing, and explains how each stage affects the quality and reproducibility of microsections.
EEE parts engineering and Product Assurance for space missions
EEE parts engineering and product assurance for space missions, including DCL support, radiation analysis, testing, and ESA/NASA compliance.
Access to Electronic Design
Design for Manufacturing (DFM) and assembly.
The document underscores that adopting DFM techniques early in the project lifecycle ensures smoother production, lower costs, and quicker time-to-market for electronic products.
Long-Term Storage of Semiconductor Wafers and DIEs
Discover how to preserve wafers and DIEs for up to 50 years while preventing diffusion, contamination, and performance degradation.
Long-Term Storage of Electronic Displays
Discover how to preserve electronic displays for up to 50 years. Learn about aging risks, material degradation, and advanced long-term storage solutions.
Long-Term Storage of Electronic Assemblies and Devices
Learn how to store electronic assemblies and devices for up to 50 years while preventing failures, corrosion, and obsolescence risks.
SEL-PROTECTS Project: Single-Event Latch-up PROTECTion devices for Space
SEL-PROTECTS develops an adaptive mixed-signal IC that protects COTS space electronics from Single-Event Latch-Up (SEL) by monitoring current consumption and autonomously disconnecting power before destructive radiation events occur.
Inside the Component (Part II): Cross-Section Testing for Space Qualification & ECSS Compliance
In the second session of our “Inside the Component” series, we explore the cross-section tests required to certify electronic components for space missions. From PCB evaluations to wire-crimping and press-fit qualification, this session shows how cross-sectioning provides the physical evidence demanded by ECSS standards. You will learn how these results support destructive physical analysis (DPA), uncover manufacturing defects, and determine whether a device is truly fit for purpose in the extreme environment of space. Ideal for quality managers, project leaders, and professionals involved in space component qualification.
Inside the Component (Part I): Mastering Cross-Section Sample Preparation for Space Electronics
Discover why rigorous cross-section sample preparation is essential for accurate failure analysis and reliability verification in space-grade electronics. This webinar walks you through every step, cutting, mounting, grinding, and polishing, and explains how each stage affects the quality and reproducibility of microsections.
EEE parts engineering and Product Assurance for space missions
EEE parts engineering and product assurance for space missions, including DCL support, radiation analysis, testing, and ESA/NASA compliance.
Advanced Materials for Space Radiation Shielding
Discover how the SRPROTEC project develops advanced composite materials to shield electronics from harmful space radiation
Physical Characterization of QFN Test Vehicles Manufactured with Radiation-Shielding Materials
Explore SRPROTEC project QFN test vehicles made with novel radiation-shielding composites for advanced electronic protection
Characterization of Novel Composite Materials with Radiation Shielding Properties for Electronic Encapsulation (SRPROTEC Project)
Discover SRPROTEC project innovations: novel composite materials with advanced radiation shielding for safe and reliable electronic encapsulation
Entangled photon sources for quantum communications
Entangled Photon Sources enable secure quantum communication through SPDC, ideal for high-loss space applications.
Electromagnetic Compatibility EMC requirements and testing
Electromagnetic Compatibility (EMC) ensures devices operate reliably without causing or suffering electromagnetic interference.
Long-Term Storage of Electronic Assemblies and Devices
Learn how to store electronic assemblies and devices for up to 50 years while preventing failures, corrosion, and obsolescence risks.
SEL-PROTECTS Project: Single-Event Latch-up PROTECTion devices for Space
SEL-PROTECTS develops an adaptive mixed-signal IC that protects COTS space electronics from Single-Event Latch-Up (SEL) by monitoring current consumption and autonomously disconnecting power before destructive radiation events occur.
A Novel Adaptive IC for Protecting COTS against SEL
Discover the main risks of using COTS electronics in space, including TID degradation, SEE, and Single-Event Latch-up.
Why SEL is one of the most critical radiation-induced failure mechanisms for mission reliability.
Why Nitrogen Storage Is Not Enough for Electronic Components
Nitrogen storage addresses only a limited subset of aging factors.
It does not control: Diffusion, Internal contamination, Material interactions, Long-term degradation processes.
For true long-term preservation, a holistic storage approach is required
What Causes Aging in Electronic Components During Storage?
Electronic component aging is driven by multiple interacting factors. To ensure long-term availability and reliability, storage strategies must address all degradation mechanisms simultaneously.
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A Novel Adaptive IC for Protecting COTS against SEL
Discover the main risks of using COTS electronics in space, including TID degradation, SEE, and Single-Event Latch-up.
Why SEL is one of the most critical radiation-induced failure mechanisms for mission reliability.
Why Nitrogen Storage Is Not Enough for Electronic Components
Nitrogen storage addresses only a limited subset of aging factors.
It does not control: Diffusion, Internal contamination, Material interactions, Long-term degradation processes.
For true long-term preservation, a holistic storage approach is required
What Causes Aging in Electronic Components During Storage?
Electronic component aging is driven by multiple interacting factors. To ensure long-term availability and reliability, storage strategies must address all degradation mechanisms simultaneously.
Long-Term Storage of Semiconductor Wafers and DIEs
Discover how to preserve wafers and DIEs for up to 50 years while preventing diffusion, contamination, and performance degradation.
Long-Term Storage of Electronic Displays
Discover how to preserve electronic displays for up to 50 years. Learn about aging risks, material degradation, and advanced long-term storage solutions.
Long-Term Storage of Electronic Assemblies and Devices
Learn how to store electronic assemblies and devices for up to 50 years while preventing failures, corrosion, and obsolescence risks.
SEL-PROTECTS Project: Single-Event Latch-up PROTECTion devices for Space
SEL-PROTECTS develops an adaptive mixed-signal IC that protects COTS space electronics from Single-Event Latch-Up (SEL) by monitoring current consumption and autonomously disconnecting power before destructive radiation events occur.
Inside the Component (Part II): Cross-Section Testing for Space Qualification & ECSS Compliance
In the second session of our “Inside the Component” series, we explore the cross-section tests required to certify electronic components for space missions. From PCB evaluations to wire-crimping and press-fit qualification, this session shows how cross-sectioning provides the physical evidence demanded by ECSS standards. You will learn how these results support destructive physical analysis (DPA), uncover manufacturing defects, and determine whether a device is truly fit for purpose in the extreme environment of space. Ideal for quality managers, project leaders, and professionals involved in space component qualification.
Inside the Component (Part I): Mastering Cross-Section Sample Preparation for Space Electronics
Discover why rigorous cross-section sample preparation is essential for accurate failure analysis and reliability verification in space-grade electronics. This webinar walks you through every step, cutting, mounting, grinding, and polishing, and explains how each stage affects the quality and reproducibility of microsections.
EEE parts engineering and Product Assurance for space missions
EEE parts engineering and product assurance for space missions, including DCL support, radiation analysis, testing, and ESA/NASA compliance.
Access to Datasheet
Click now to access valuable resources and elevate your semiconductor solutions with ALTER.
Long-Term Storage of Electronic Assemblies and Devices
Learn how to store electronic assemblies and devices for up to 50 years while preventing failures, corrosion, and obsolescence risks.
SEL-PROTECTS Project: Single-Event Latch-up PROTECTion devices for Space
SEL-PROTECTS develops an adaptive mixed-signal IC that protects COTS space electronics from Single-Event Latch-Up (SEL) by monitoring current consumption and autonomously disconnecting power before destructive radiation events occur.
Inside the Component (Part II): Cross-Section Testing for Space Qualification & ECSS Compliance
In the second session of our “Inside the Component” series, we explore the cross-section tests required to certify electronic components for space missions. From PCB evaluations to wire-crimping and press-fit qualification, this session shows how cross-sectioning provides the physical evidence demanded by ECSS standards. You will learn how these results support destructive physical analysis (DPA), uncover manufacturing defects, and determine whether a device is truly fit for purpose in the extreme environment of space. Ideal for quality managers, project leaders, and professionals involved in space component qualification.
Inside the Component (Part I): Mastering Cross-Section Sample Preparation for Space Electronics
Discover why rigorous cross-section sample preparation is essential for accurate failure analysis and reliability verification in space-grade electronics. This webinar walks you through every step, cutting, mounting, grinding, and polishing, and explains how each stage affects the quality and reproducibility of microsections.
EEE parts engineering and Product Assurance for space missions
EEE parts engineering and product assurance for space missions, including DCL support, radiation analysis, testing, and ESA/NASA compliance.
Advanced Materials for Space Radiation Shielding
Discover how the SRPROTEC project develops advanced composite materials to shield electronics from harmful space radiation
Physical Characterization of QFN Test Vehicles Manufactured with Radiation-Shielding Materials
Explore SRPROTEC project QFN test vehicles made with novel radiation-shielding composites for advanced electronic protection
Characterization of Novel Composite Materials with Radiation Shielding Properties for Electronic Encapsulation (SRPROTEC Project)
Discover SRPROTEC project innovations: novel composite materials with advanced radiation shielding for safe and reliable electronic encapsulation
Entangled photon sources for quantum communications
Entangled Photon Sources enable secure quantum communication through SPDC, ideal for high-loss space applications.
Electromagnetic Compatibility EMC requirements and testing
Electromagnetic Compatibility (EMC) ensures devices operate reliably without causing or suffering electromagnetic interference.
Long-Term Storage of Electronic Assemblies and Devices
Learn how to store electronic assemblies and devices for up to 50 years while preventing failures, corrosion, and obsolescence risks.
SEL-PROTECTS Project: Single-Event Latch-up PROTECTion devices for Space
SEL-PROTECTS develops an adaptive mixed-signal IC that protects COTS space electronics from Single-Event Latch-Up (SEL) by monitoring current consumption and autonomously disconnecting power before destructive radiation events occur.
Inside the Component (Part II): Cross-Section Testing for Space Qualification & ECSS Compliance
In the second session of our “Inside the Component” series, we explore the cross-section tests required to certify electronic components for space missions. From PCB evaluations to wire-crimping and press-fit qualification, this session shows how cross-sectioning provides the physical evidence demanded by ECSS standards. You will learn how these results support destructive physical analysis (DPA), uncover manufacturing defects, and determine whether a device is truly fit for purpose in the extreme environment of space. Ideal for quality managers, project leaders, and professionals involved in space component qualification.
Inside the Component (Part I): Mastering Cross-Section Sample Preparation for Space Electronics
Discover why rigorous cross-section sample preparation is essential for accurate failure analysis and reliability verification in space-grade electronics. This webinar walks you through every step, cutting, mounting, grinding, and polishing, and explains how each stage affects the quality and reproducibility of microsections.
EEE parts engineering and Product Assurance for space missions
EEE parts engineering and product assurance for space missions, including DCL support, radiation analysis, testing, and ESA/NASA compliance.
Advanced Materials for Space Radiation Shielding
Discover how the SRPROTEC project develops advanced composite materials to shield electronics from harmful space radiation
Physical Characterization of QFN Test Vehicles Manufactured with Radiation-Shielding Materials
Explore SRPROTEC project QFN test vehicles made with novel radiation-shielding composites for advanced electronic protection
Characterization of Novel Composite Materials with Radiation Shielding Properties for Electronic Encapsulation (SRPROTEC Project)
Discover SRPROTEC project innovations: novel composite materials with advanced radiation shielding for safe and reliable electronic encapsulation
Entangled photon sources for quantum communications
Entangled Photon Sources enable secure quantum communication through SPDC, ideal for high-loss space applications.
Electromagnetic Compatibility EMC requirements and testing
Electromagnetic Compatibility (EMC) ensures devices operate reliably without causing or suffering electromagnetic interference.