Whiskers Analysis

Tin whiskers are microscopic, conductive, hair-like crystalline structures that spontaneously grow from pure-tinned and electroplated surfaces. These metallic fibers pose a significant risk in electronic components, as they can lead to electrical short circuits and failures. Their unpredictable growth, often triggered by mechanical stress, thermal cycling, or environmental conditions, makes them a serious concern for applications requiring high reliability, such as aerospace, automotive, and medical electronics. 

At ALTER, we specialise in whisker analysis and mitigation strategies through comprehensive laboratory testing. Our state-of-the-art facilities and industry-compliant methodologies allow us to assess the risks associated with tin whiskers and provide data-driven solutions to enhance the reliability of your electronic components. 

1. Growth on surface mount devices: a study using standarized test conditions
2. Experimental Methods
3. Results
4. Conclusions