Highly Accelerated Stress Testing (HAST)

  

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The Highly Accelerated Stress Testing (HAST) service from ALTER is designed to assess the reliability of non-hermetic packaged semiconductor devices operating in humid conditions. Also known as the Pressure Cooker Test (PCT) or Unsaturated Pressure Cooker Test, HAST simulates severe environmental conditions by elevating the water vapor pressure inside the test chamber to levels far exceeding those encountered under normal ambient conditions. 

What is HAST?

HAST is an accelerated temperature and humidity stress test that offers several key advantages: 

  • Evaluates humidity resistance: by increasing vapor pressure in the test chamber, devices are subjected to harsher conditions than in standard operations. 
  • Reduces testing time: operating at temperatures up to 130 °C and elevated pressures, 96 hours of HAST testing can equate to approximately 1000 hours of conventional humidity testing (85 °C/85% RH). 
  • Replicates real failure mechanisms: despite the accelerated process, the test faithfully reproduces the failure modes observed in standard humidity tests. 

Testing standards and methodologies

Our HAST service adheres to the most recognized international standards to ensure reliable and consistent results: 

  • IEC 60068-2-66 (1994-6): Environmental Testing – Part 2, Test Cx: Damp Heat, Steady-State (Unsaturated Pressurized Vapor). 
  • IEC 60749 Amendment 1 (1991-11): Semiconductor Devices Mechanical and Climatic Test Methods for Damp Heat, Steady-State Highly Accelerated Testing. 
  • JEDEC Standard No.22-110 (1988-6): Test Method A110 for Highly Accelerated Temperature and Humidity Stress Testing. 
  • EIAJ ED-4701 (1992-2): Japanese Standard for Environmental and Duration Testing Methods for Semiconductor Devices – Unsaturated Vapor Pressure Test. 

Key benefits of HAST

  • Efficient screening process: ideal for critical applications such as space, where rapid screening and reliable results are crucial. 
  • Adaptability for COTS components: as Commercial Off-The-Shelf parts become increasingly used in space and other demanding environments, HAST offers a swift response for component screening and certification. 
  • Optimized validation processes: accelerated testing reduces overall validation time, streamlining development and production cycles without compromising on quality. 

Why choose ALTER for HAST?

At ALTER, we merge extensive expertise in engineering services with state-of-the-art laboratory testing to offer customized, advanced testing solutions. Our HAST service is designed to deliver: 

  • Accurate, representative results: Utilizing proven methodologies in compliance with international standards. 
  • Time and cost efficiency: Streamlined testing processes that reduce time-to-market and optimize production cycles. 
  • Comprehensive support: Personalized technical guidance and support throughout every stage of the testing process. 

 

Optimize the reliability of your semiconductor devices with our Highly Accelerated Stress Testing (HAST) service. Ensure your products meet the highest quality standards—even under the most demanding conditions. 

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