In the second session of our “Inside the Component” series, we explore the cross-section tests required to certify electronic components for space missions. From PCB evaluations to wire-crimping and press-fit qualification, this session shows how cross-sectioning provides the physical evidence demanded by ECSS standards. You will learn how these results support destructive physical analysis (DPA), uncover manufacturing defects, and determine whether a device is truly fit for purpose in the extreme environment of space. Ideal for quality managers, project leaders, and professionals involved in space component qualification.
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Inside the Component (Part I): Mastering Cross-Section Sample Preparation for Space Electronics
Discover why rigorous cross-section sample preparation is essential for accurate failure analysis and reliability verification in space-grade electronics. This webinar walks you through every step, cutting, mounting, grinding, and polishing, and explains how each stage affects the quality and reproducibility of microsections.
Glassivation integrity in electronic components
Glassivation testing ensures the dielectric layer integrity in semiconductor devices to prevent issues like electromigration.
Thermoreflectance Thermal Imaging (TTI) for microelectronics
Thermoreflectance Thermal Imaging (TTI) maps micro-scale temperature gradients to detect hot spots in microelectronic devices.
Raman Thermography for semiconductor devices
Raman thermometry measures local temperature in microelectronics using Raman scattering with sub-micron spatial resolution.
Focused Ion Beam (FIB): Precision micro-sectioning for semiconductor analysis
Focused Ion Beam (FIB) enables precise micro-sectioning for failure analysis and die inspection in microelectronic devices.
PCB Failure Analysis: Pad Cratering
Pad cratering involves fractures at the pad-resin interface in PCBs, affecting long-term assembly reliability.
Degolding and retinning processes on leadless SMD packaged devices
Degolding removes gold from RF device pads, but can affect coplanarity and cause test issues in high-frequency applications.
Seal Test: Fine and Gross Leak methods for electronic components
Seal test checks component hermeticity using fine and gross leak methods to ensure long-term reliability and contamination control.
PTV Failure: Manufacturing defects
PTV failure in PCBs involves cracks or voids from poor plating, impacting reliability under thermal or mechanical stress.
X-Ray Fluorescence (XRF) techniques for materials verification
X-Ray Fluorescence (XRF) identifies elemental composition in materials, supporting quality control and compliance in electronic systems.
Inspection of Plated Through Vias (PTVs) in PCB systems
Plated Through Vias (PTVs) are key to PCB reliability; defects require microsection analysis to detect manufacturing or thermal failures.
Thermomechanical failures in Plated Through Vias (PTVs)
Thermomechanical failures in PTVs result from CTE mismatches, causing fatigue cracks and inner-layer separation during thermal cycling.
Soldering verification of Surface Mounted Devices (SMD) and PCB assemblies
Soldering verification ensures the integrity of SMD assemblies through visual, thermal, vibration, and microsection tests per ECSS standards.
SAM capabilities and scan modes
SAM enables non-destructive internal inspection of materials, detecting delaminations and defects with micrometric resolution.
C-SAM: Non-destructive inspection of microelectronic parts
C-SAM is a non-destructive technique used to detect internal defects like delamination in microelectronic components via acoustic imaging.
C-SAM for internal defect screening in advanced EEE components
C-SAM detects internal defects like delamination and voids in microelectronics, ensuring reliability through non-destructive inspection.
C-SAM Inspection of Microelectronic parts
Detect hidden defects in microelectronics with real-time, non-destructive inspection using advanced acoustic microscopy.
Improper degree of compression in crimped connectors
Crimped connectors must meet compression standards to ensure contact integrity; poor crimping increases resistance and causes failure
Electrothermal events in crimped connectors
Crimped connectors can fail from electrothermal events, where overheating degrades contact quality and increases resistance.